02050oam 2200541zu 450 99620300960331620210807003700.01-4244-6026-3(CKB)2400000000002664(SSID)ssj0001679730(PQKBManifestationID)16489667(PQKBTitleCode)TC0001679730(PQKBWorkID)15014117(PQKB)11466052(EXLCZ)99240000000000266420160829d2010 uy engtxtccrDELTA 2010 : Fifth IEEE International Symposium on Electronic Design, Test & Applications : proceedings : 13-15 January 2010, Ho Chi Minh City, Vietnam[Place of publication not identified]IEEE Computer Society2010Bibliographic Level Mode of Issuance: Monograph1-4244-6025-5 0-7695-3978-5 ElectronicsResearchCongressesElectronicsDesignCongressesElectronicsTestingCongressesElectrical EngineeringHILCCElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectronicsResearchElectronicsDesignElectronicsTestingElectrical EngineeringElectrical & Computer EngineeringEngineering & Applied Sciences621.381IEEE Computer SocietyIEEE Computer Society Technical Council on Test Technology.£òai hòoc quâãoc gia TP Háão Châi MinhIEEE Vietnam SectionIEEE International Symposium on Electronic Design, Test and ApplicationsPQKBPROCEEDING996203009603316DELTA 2010 : Fifth IEEE International Symposium on Electronic Design, Test & Applications : proceedings : 13-15 January 2010, Ho Chi Minh City, Vietnam2415597UNISA