01809oam 2200469zu 450 99620292750331620210806235739.0(CKB)1000000000022186(SSID)ssj0000395391(PQKBManifestationID)12119854(PQKBTitleCode)TC0000395391(PQKBWorkID)10450482(PQKB)10209266(EXLCZ)99100000000002218620160829d2003 uy engtxtccr2003 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 2003[Place of publication not identified]IEEE Society2003Bibliographic Level Mode of Issuance: Monograph0-7803-8157-2 Integrated circuitsReliabilityCongressesIntegrated circuitsReliabilityWafer-scale integrationCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCIntegrated circuitsReliabilityIntegrated circuitsReliabilityWafer-scale integrationElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.3815IEEE Reliability SocietyIEEE Electron Devices SocietyInternational Integrated Reliability WorkshopPQKBPROCEEDING9962029275033162003 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Camp, Lake Tahoe, California, October 20-23, 20032537841UNISA