01813oam 2200469zu 450 99620249880331620210806235720.0(CKB)1000000000022026(SSID)ssj0000395390(PQKBManifestationID)12081924(PQKBTitleCode)TC0000395390(PQKBWorkID)10450871(PQKB)10313306(EXLCZ)99100000000002202620160829d2002 uy engtxtccr2002 IEEE International Integrated Reliability Workshop : final report : Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 2002[Place of publication not identified]IEEE Society2002Bibliographic Level Mode of Issuance: Monograph0-7803-7558-0 Integrated circuitsReliabilityCongressesIntegrated circuitsWafer-scale integrationReliabilityCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCIntegrated circuitsReliabilityIntegrated circuitsWafer-scale integrationReliabilityElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.3815IEEE Reliability SocietyIEEE Electron Devices SocietyInternational Integrated Reliability WorkshopPQKBPROCEEDING9962024988033162002 IEEE International Integrated Reliability Workshop : final report : Stanford Sierra Camp, Lake Tahoe, California, October 21-24, 20022513244UNISA