02246oam 2200517zu 450 99620225430331620210806235726.01-5386-0067-6(CKB)1000000000021952(SSID)ssj0000395950(PQKBManifestationID)12102812(PQKBTitleCode)TC0000395950(PQKBWorkID)10456889(PQKB)11611499(EXLCZ)99100000000002195220160829d2005 uy engtxtccr6th International Symposium on Quality Electronic Design : proceedings : March 21-23, 2005, San Jose, California[Place of publication not identified]IEEE Computer Society2005Bibliographic Level Mode of Issuance: Monograph0-7695-2301-3 Integrated circuitsReliabilityVery large scale integrationCongressesIntegrated circuitsVery large scale integrationDesign and constructionCongressesIntegrated circuitsVery large scale integrationComputer-aided designCongressesIntegrated circuitsVery large scale integrationTestingQuality controlCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCIntegrated circuitsReliabilityVery large scale integrationIntegrated circuitsVery large scale integrationDesign and constructionIntegrated circuitsVery large scale integrationComputer-aided designIntegrated circuitsVery large scale integrationTestingQuality controlElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.39/5IEEE Electron Devices SocietyInternational Symposium on Quality Electronic DesignPQKBPROCEEDING9962022543033166th International Symposium on Quality Electronic Design : proceedings : March 21-23, 2005, San Jose, California2406094UNISA