01998oam 2200517zu 450 99620216450331620210806235943.0(CKB)1000000000022369(SSID)ssj0000396665(PQKBManifestationID)12164748(PQKBTitleCode)TC0000396665(PQKBWorkID)10342666(PQKB)10335412(EXLCZ)99100000000002236920160829d2004 uy engtxtccrInternational Test Conference 2004 : proceedings : October 26-October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA[Place of publication not identified]International Test Conference2004Bibliographic Level Mode of Issuance: Monograph0-7803-8580-2 Integrated circuitsTestingCongressesElectronic digital computersTestingCircuitsCongressesTelecommunicationCongressesRadio frequencyCongressesElectrical EngineeringHILCCElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCIntegrated circuitsTestingElectronic digital computersTestingCircuitsTelecommunicationRadio frequencyElectrical EngineeringElectrical & Computer EngineeringEngineering & Applied Sciences621.3815/48IEEE Computer Society Test Technology Technical CommitteeInstitute of Electrical and Electronics Engineers Philadelphia Section.International Test ConferencePQKBPROCEEDING996202164503316International Test Conference 2004 : proceedings : October 26-October 28, 2004, Charlotte Convention Center, Charlotte, NC, USA2500372UNISA