02275oam 2200529zu 450 99620209830331620210807002718.01-5090-8811-3(CKB)1000000000331006(SSID)ssj0000395948(PQKBManifestationID)12119828(PQKBTitleCode)TC0000395948(PQKBWorkID)10456817(PQKB)10546812(EXLCZ)99100000000033100620160829d2007 uy engtxtccr8th International Symposium on Quality Electronic Design : ISQED 2007 : proceedings : San Jose, California : 26-28 March[Place of publication not identified]IEEE Computer Society2007Bibliographic Level Mode of Issuance: Monograph0-7695-2795-7 Integrated circuitsReliabilityVery large scale integrationCongressesIntegrated circuitsVery large scale integrationDesign and constructionCongressesIntegrated circuitsVery large scale integrationComputer-aided designCongressesIntegrated circuitsTestingQuality controlVery large scale integrationCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCIntegrated circuitsReliabilityVery large scale integrationIntegrated circuitsVery large scale integrationDesign and constructionIntegrated circuitsVery large scale integrationComputer-aided designIntegrated circuitsTestingQuality controlVery large scale integrationElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.39/5Synopsys (Firm)IEEE Electron Devices SocietyIEEE Circuits and Systems SocietyPQKBPROCEEDING9962020983033168th International Symposium on Quality Electronic Design : ISQED 2007 : proceedings : San Jose, California : 26-28 March2333388UNISA