02158oam 2200493zu 450 99620068220331620210807003527.0(CKB)111055184227404(SSID)ssj0000395944(PQKBManifestationID)12171348(PQKBTitleCode)TC0000395944(PQKBWorkID)10456888(PQKB)11155067(EXLCZ)9911105518422740420160829d2002 uy engtxtccrInternational Symposium on Quality Electronic Design : 18-21 March, 2002, San Jose, California : proceedings[Place of publication not identified]IEEE Computer Society2002Bibliographic Level Mode of Issuance: Monograph0-7695-1561-4 Integrated circuitsReliabilityVery large scale integrationCongressesIntegrated circuitsDesign and constructionVery large scale integrationCongressesIntegrated circuitsVery large scale integrationComputer-aided designCongressesIntegrated circuitsVery large scale integrationQuality controlTestingCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCIntegrated circuitsReliabilityVery large scale integrationIntegrated circuitsDesign and constructionVery large scale integrationIntegrated circuitsVery large scale integrationComputer-aided designIntegrated circuitsVery large scale integrationQuality controlTestingElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.39/5IEEE Computer Society Technical Committee on VLSI,PQKBPROCEEDING996200682203316International Symposium on Quality Electronic Design : 18-21 March, 2002, San Jose, California : proceedings2359231UNISA