01985oam 2200517zu 450 99620068050331620210807003529.0(CKB)111055184228438(SSID)ssj0000395443(PQKBManifestationID)12084995(PQKBTitleCode)TC0000395443(PQKBWorkID)10450598(PQKB)10557469(EXLCZ)9911105518422843820160829d2002 uy engtxtccrProceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France[Place of publication not identified]IEEE Computer Society2002Bibliographic Level Mode of Issuance: Monograph0-7695-1617-3 Semiconductor storage devicesTestingCongressesRandom access memoryCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCSemiconductor storage devicesTestingRandom access memoryElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.39/732Wik TCourtois BZorian YervantIEEE Computer SocietyIEEE Computer Society Technical Council on Test Technology.IEEE Computer Society Technical Committee on VLSI,IEEE International Workshop on Memory Technology, Design and TestingPQKBPROCEEDING996200680503316Proceedings of the 2002 IEEE International Workshop on Memory Technology, Design and Testing : (MTDT 2002) : 10-12 July, 2002, Isle of Bendor, France2372861UNISA