01900oam 2200529zu 450 99619992450331620210807000241.0(CKB)1000000000021902(SSID)ssj0000396671(PQKBManifestationID)12130052(PQKBTitleCode)TC0000396671(PQKBWorkID)10335044(PQKB)10280759(SSID)ssj0000445321(PQKBManifestationID)12210707(PQKBTitleCode)TC0000445321(PQKBWorkID)10485108(PQKB)11639110(EXLCZ)99100000000002190220160829d2006 uy engtxtccrProceedings of the 15th Asian Test Symposium : 20-23 November 2006, Fukuoka, Japan[Place of publication not identified]IEEE Computer Society Press2004Bibliographic Level Mode of Issuance: Monograph0-7695-2235-1 Electronic digital computersTestingCircuitsCongressesElectronic circuitsTestingCongressesFault-tolerant computingCongressesElectrical EngineeringHILCCElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectronic digital computersTestingCircuitsElectronic circuitsTestingFault-tolerant computingElectrical EngineeringElectrical & Computer EngineeringEngineering & Applied Sciences621.3815/48IEEE Computer Society Test Technology Council (TTTC).PQKBPROCEEDING996199924503316Proceedings of the 15th Asian Test Symposium : 20-23 November 2006, Fukuoka, Japan2297370UNISA