01649oam 2200457zu 450 99619963110331620210807003526.0(CKB)111026746724010(SSID)ssj0000396610(PQKBManifestationID)12146167(PQKBTitleCode)TC0000396610(PQKBWorkID)10343668(PQKB)11250567(EXLCZ)9911102674672401020160829d1999 uy engtxtccr1999 4th International Workshop on Statistical Metrology[Place of publication not identified]Purchased from IEEE Service Center Single Publication Sales Unit1999Bibliographic Level Mode of Issuance: Monograph0-7803-5154-1 SemiconductorsCharacterizationStatistical methodsCongressesSemiconductorsMeasurementCongressesElectrical EngineeringHILCCElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCSemiconductorsCharacterizationStatistical methodsSemiconductorsMeasurementElectrical EngineeringElectrical & Computer EngineeringEngineering & Applied Sciences621.3815/2/0287IEEE Electron Devices SocietyInternational Workshop on Statistical MetrologyPQKBPROCEEDING9961996311033161999 4th International Workshop on Statistical Metrology2546904UNISA