01028nam 2200349 450 99619886200331620231020022155.01-5090-9801-1(CKB)1000000000330896(NjHacI)991000000000330896(EXLCZ)99100000000033089620231020d2006 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrier2006 15th Asian Test Symposium /IEEE Computer SocietyLos Alamitos, California :IEEE,2006.1 online resource (xxiii, 451 pages) illustrations0-7695-2628-4 15th Asian Test Symposium atsElectronic circuitsTestingElectronic circuitsTesting.621.381548015192NjHacINjHaclPROCEEDING9961988620033162006 15th Asian Test Symposium2422583UNISA