01960oam 2200493zu 450 99619822360331620210807003401.0(CKB)111026746739696(SSID)ssj0000437077(PQKBManifestationID)12160239(PQKBTitleCode)TC0000437077(PQKBWorkID)10431836(PQKB)10969651(EXLCZ)9911102674673969620160829d1994 uy engtxtccrThird International Conference on the Economics of Design, Test, and Manufacturing : proceedings, May 16-17, 1994, Austin, Texas[Place of publication not identified]IEEE Computer Society Press1994Bibliographic Level Mode of Issuance: Monograph0-8186-6595-5 Electronic circuitsCostsCongressesElectronic circuit designDecision makingCongressesElectronic circuitsTestingCostsCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCElectronic circuitsCostsCongressesElectronic circuit designDecision makingCongressesElectronic circuitsTestingCostsCongressesElectrical & Computer EngineeringEngineering & Applied SciencesElectrical EngineeringAmbler TonyAbadir MIEEE Computer Society Test Technology Technical CommitteeInternational Conference on the Economics of Design, Test, and ManufacturingPQKBBOOK996198223603316Third International Conference on the Economics of Design, Test, and Manufacturing : proceedings, May 16-17, 1994, Austin, Texas2524678UNISA