01913oam 2200493zu 450 99619788660331620210807002842.01-5090-9096-71-4244-0297-2(CKB)1000000000525143(SSID)ssj0000395393(PQKBManifestationID)12118412(PQKBTitleCode)TC0000395393(PQKBWorkID)10450559(PQKB)10140547(EXLCZ)99100000000052514320160829d2006 uy engtxtccr2006 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 16-19, 2006[Place of publication not identified]Electron Devices Society2006Bibliographic Level Mode of Issuance: Monograph1-4244-0296-4 Integrated circuitsReliabilityCongressesIntegrated circuitsReliabilityWafer-scale integrationCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCIntegrated circuitsReliabilityIntegrated circuitsReliabilityWafer-scale integrationElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.3815IEEE Reliability SocietyIEEE Electron Devices SocietyInternational Integrated Reliability WorkshopPQKBPROCEEDING9961978866033162006 IEEE International Integrated Reliability Workshop final report : Stanford Sierra Conference Center, S. Lake Tahoe, California, October 16-19, 20062514867UNISA