02505oam 2200577zu 450 99619758620331620240610210559.01-5090-9459-8(CKB)1000000000278069(SSID)ssj0000395947(PQKBManifestationID)12111753(PQKBTitleCode)TC0000395947(PQKBWorkID)10459122(PQKB)10667513(Association for Computing Machinery)10.5555/1126255(EXLCZ)99100000000027806920160829d2006 uy engurnn#008mam|atxtrdacontentcrdamediacrrdacarrier7th International Symposium on Quality Electronic Design : ISQED 2006, proceedings : 27-29 March 2006, San Jose, California[Place of publication not identified] :IEEE Computer Society,2006.ACM Conferences.Bibliographic Level Mode of Issuance: Monograph0-7695-2523-7 ISQED '06Integrated circuitsReliabilityVery large scale integrationCongressesIntegrated circuitsVery large scale integrationDesign and constructionCongressesIntegrated circuitsComputer-aided designVery large scale integrationCongressesIntegrated circuitsTestingQuality controlVery large scale integrationCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCIntegrated circuitsReliabilityVery large scale integrationIntegrated circuitsVery large scale integrationDesign and constructionIntegrated circuitsComputer-aided designVery large scale integrationIntegrated circuitsTestingQuality controlVery large scale integrationElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.3815IEEE Electron Devices SocietyComponents, Packaging & Manufacturing Technology SocietyIEEE Circuits and Systems SocietyPQKBPROCEEDING9961975862033167th International Symposium on Quality Electronic Design : ISQED 2006, proceedings : 27-29 March 2006, San Jose, California1924931UNISA