01622oam 2200445zu 450 99619757270331620210806235906.01-5090-9624-8(CKB)1000000000278103(SSID)ssj0000396672(PQKBManifestationID)12119941(PQKBTitleCode)TC0000396672(PQKBWorkID)10335716(PQKB)11451145(EXLCZ)99100000000027810320160829d2006 uy engtxtccrEleventh IEEE European Test Symposium : ETS 2006 : proceedings : 21-24 May, 2006, [Hilton Hotel] Southampton, United Kingdom[Place of publication not identified]IEEE Computer Society Press2006Bibliographic Level Mode of Issuance: Monograph0-7695-2566-0 Integrated circuitsTestingCongressesElectrical EngineeringHILCCElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCIntegrated circuitsTestingElectrical EngineeringElectrical & Computer EngineeringEngineering & Applied Sciences621.3815/48IEEE Computer Society Technical Council on Test Technology.IEEE European Test SymposiumPQKBPROCEEDING996197572703316Eleventh IEEE European Test Symposium : ETS 2006 : proceedings : 21-24 May, 2006, Southampton, United Kingdom2351969UNISA