01004nam0-2200313---450-99000999121040332120150827100914.0000999121FED01000999121(Aleph)000999121FED0100099912120150827d--------km-y0itay50------bafreFRaf------001yy<<Le >>Musée GrévinClaude Cézandessins originaux de François Lafaye4 reproductions en couleurs et 80 héliogravures d'après Jean Willeminpréface de Léon-Paul FargueParisÉditions Rombaldi1947140 p., 43 c. di tav.ill.21 cmCézan,Claude748507Fargue,Léon-Paul<1876-1947>Lafaye,FrancoisWillemin,JeanITUNINARICAUNIMARCBK990009991210403321ART.FI B 487285/2015FARBCFARBCMusée Grévin1497271UNINA01840oam 2200481zu 450 99619757090331620210806235908.01-5090-9829-1(CKB)1000000000278107(SSID)ssj0000395447(PQKBManifestationID)12164241(PQKBTitleCode)TC0000395447(PQKBWorkID)10454136(PQKB)11178292(EXLCZ)99100000000027810720160829d2006 uy engtxtccr2006 IEEE International Workshop on Memory Technology, Design, and Testing : 2-4 August 2006, Taipei, Taiwan : proceedings[Place of publication not identified]IEEE Computer Society2006Bibliographic Level Mode of Issuance: Monograph0-7695-2572-5 Semiconductor storage devicesTestingCongressesRandom access memoryCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCSemiconductor storage devicesTestingRandom access memoryElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.39/732IEEE Computer Society Technical Council on Test Technology.IEEE Computer Society Technical Committee on VLSI,IEEE International Workshop on Memory Technology, Design, and TestingPQKBPROCEEDING9961975709033162006 IEEE International Workshop on Memory Technology, Design, and Testing : 2-4 August 2006, Taipei, Taiwan : proceedings2316454UNISA