01850nam--2200469---450-99000602783020331620150505101709.0000602783USA01000602783(ALEPH)000602783USA0100060278320150416d1922----km-y0itay50------baitaIT||||||||001yyIntroduzione allo studio della psicoanalisitre parti: Lapsus. Sogno. Dottrina generale delle neurosiS. Freudcon prefazione di M. Levi Bianchiniprima traduzione italiana autorizzata sulla terza edizione tedesca del 1920 del Dott. E. WeissZurigoNapoliViennaNocera inferioreLibreria psicoanalitica internazionale19222 volumi (VIII, 437 p.)20 cmBiblioteca psicoanalitica italianafondata e diretta da M. Levi Bianchini8<<Vol. 1.:>> Lapsus. Sogno<<Vol. 2.:>> Dottrina generale delle neurosi2001Biblioteca psicoanalitica italiana, 82001001-------2001PsicanalisiBNCF150.195FREUD,Sigmund128716LEVI BIANCHINI,MarcoITsalbcISBD990006027830203316XV.2.C. 466 1-26558 F.C.XV.2.C. 466/369393BKCUOMOGIGLIO9020150416USA011223GIGLIO9020150416USA011224GIGLIO9020150416USA011227FIORELLA9020150423USA011435FIORELLA9020150423USA011435FIORELLA9020150423USA011444FIORELLA9020150423USA011444FIORELLA9020150505USA011017Introduzione allo studio della psicoanalisi222165UNISA05133nam 2200685 a 450 991014148940332120200520144314.01-118-49851-81-118-49848-81-299-18823-01-118-49850-X(CKB)2670000000333519(EBL)1120410(SSID)ssj0000831570(PQKBManifestationID)11530818(PQKBTitleCode)TC0000831570(PQKBWorkID)10880605(PQKB)11101795(Au-PeEL)EBL1120410(CaPaEBR)ebr10657802(CaONFJC)MIL450073(CaSebORM)9781118498484(MiAaPQ)EBC1120410(OCoLC)825819485(PPN)182855015(EXLCZ)99267000000033351920121023d2013 uy 0engur|n|---|||||txtccrLow voltage electron microscopy[electronic resource] principles and applications /edited by David C. Bell and Natasha Erdman1st editionHoboken John Wiley & Sons Inc.20131 online resource (257 p.)Royal Microscopical Society-John Wiley seriesDescription based upon print version of record.1-119-97111-X Includes bibliographical references and index.Cover; Current and future titles in the Royal Microscopical Society- John Wiley Series; Title Page; Copyright; List of Contributors; Preface; Chapter 1: Introduction to the Theory and Advantages of Low Voltage Electron Microscopy; 1.1 Introduction; 1.2 Historical Perspective; 1.3 Beam Interaction with Specimen-Elastic and Inelastic Scattering; 1.4 Instrument Configuration; 1.5 Influence of Electron Optics Aberrations at Low Voltages; 1.6 SEM Imaging at Low Voltages; 1.7 TEM/STEM Imaging and Analysis at Low Voltages; 1.8 Conclusion; ReferencesChapter 2: SEM Instrumentation Developments for Low kV Imaging and Microanalysis2.1 Introduction; 2.2 The Electron Source; 2.3 SEM Column Design Considerations; 2.4 Beam Deceleration; 2.5 Novel Detector Options and Energy Filters; 2.6 Low Voltage STEM in SEM; 2.7 Aberration Correction in SEM; 2.8 Conclusions; References; Chapter 3: Extreme High-Resolution (XHR) SEM Using a Beam Monochromator; 3.1 Introduction; 3.2 Limitations in Low Voltage SEM Performance; 3.3 Beam Monochromator Design and Implementation; 3.4 XHR Systems and Applications; 3.5 Conclusions; Acknowledgements; ReferencesChapter 4: The Application of Low-Voltage SEM-From Nanotechnology to Biological Research4.1 Introduction; 4.2 Specimen Preparation Considerations; 4.3 Nanomaterials Applications; 4.4 Beam Sensitive Materials; 4.5 Semiconductor Materials; 4.6 Biological Specimens; 4.7 Low-Voltage Microanalysis; 4.8 Conclusions; References; Chapter 5: Low Voltage High-Resolution Transmission Electron Microscopy; 5.1 Introduction; 5.2 So How Low is Low?; 5.3 The Effect of Chromatic Aberration and Chromatic Aberration Correction; 5.4 The Electron Monochromator; 5.5 Theoretical Tradeoffs of Low kV Imaging5.6 Our Experience at 40 keV LV-HREM5.7 Examples of LV-HREM Imaging; 5.8 Conclusions; References; Chapter 6: Gentle STEM of Single Atoms: Low keV Imaging and Analysis at Ultimate Detection Limits; 6.1 Introduction; 6.2 Optimizing STEM Resolution and Probe Current at Low Primary Energies; 6.3 STEM Image Formation; 6.4 Gentle STEM Applications; 6.5 Discussion; 6.6 Conclusion; Acknowledgements; References; Chapter 7: Low Voltage Scanning Transmission Electron Microscopy of Oxide Interfaces; 7.1 Introduction; 7.2 Methods and Instrumentation; 7.3 Low Voltage Imaging and Spectroscopy; 7.4 SummaryAcknowledgementsReferences; Chapter 8: What's Next? The Future Directions in Low Voltage Electron Microscopy; 8.1 Introduction; 8.2 Unique Low Voltage SEM and TEM Instruments; 8.3 Cameras, Detectors, and Other Accessories; 8.4 Conclusions; References; Index"Part of the Wiley-Royal Microscopical Society Series, this book discusses the rapidly developing cutting-edge field of low-voltage microscopy, a field that has only recently emerged due to the rapid developments in the electron optics design and image processing. It serves as a guide for current and new microscopists and materials scientists who are active in the field of nanotechnology, and presents applications in nanotechnology and research of surface-related phenomena, allowing researches to observe materials as never before"--Provided by publisher.RMS-Wiley series.Electron microscopyTechniqueElectron microscopyTechnique.502.8/25SCI047000bisacshBell D. C(David C.)911616Erdman Natasha911617MiAaPQMiAaPQMiAaPQBOOK9910141489403321Low voltage electron microscopy2041446UNINA