01022nam0-22003371i-450-99000051251040332120080806122639.00-07-100208-1000051251FED01000051251(Aleph)000051251FED0100005125120020821d1987----km-y0itay50------baenga-------001yySoftware reliabilitymeasurement, prediction, applicationJohn D. Musa, Anthony Iannino, Kazuhira OkumotoNew YorkMcGraw-Hill©1987621 p.ill.22 cmMcGraw-Hill series in software engineering and technologySoftware005.1'4Musa,John D.492102Iannino,Anthony492103Okumoto,Kazuhira492104ITUNINARICAUNIMARCBK99000051251040332110 P.T. 5711898 DISDINELDINELSoftware reliability330509UNINA01151nam--2200385---450-99000345187020331620101008134500.00-201-52820-7000345187USA01000345187(ALEPH)000345187USA0100034518720101008d1989----km-y0itay50------baengUS||||||||001yyField and Wave ElectromagneticsDavid K. Cheng2. ed.ReadingAddison-Wesley1989XVI, 703 p.24 cmAddison-Wesley Series in Electrical Engineering2001Addison-Wesley Series in Electrical Engineering2001001-------2001Campi elettromagnetici [e] Onde elettromagneticheBNCF530.141CHENG,David K.45713ITsalbcISBD990003451870203316530.141 CHE21926 Ing.530.141 CHE00283106BKGIUFIORELLA9020101008USA011345Field and Wave Electromagnetics1108984UNISA