01516nam--2200409---450-99000297234020331620070913132250.03-540-37236-9000297234USA01000297234(ALEPH)000297234USA0100029723420070913d2006----km-y0itay0103----baengDE||||||||001yyStructural, Syntactic, and Statistical pattern recognitionJoint IAPR International workshops SSPR 2006 and SPR 2006Dit-Yan YeungHong Kong, CHina, August 17-19, 2006proceedingsBerlinSpringercopyr. 2006XXI, 939 p.ill.20 cmLecture notes in computer science41092001Lecture notes in computer science41092001001-------2001Ottica <informatica>SimulazioneHong Kong2006Impiego degli elaboratori elettroniciCongressi006.424YEUNG,Dit-YanJoint IAPR International workshops SSPR 2006 and SPR 2006Hong Kong><2006 ;598253ITCBSISBD990002972340203316001 LNCS 410934044/CBS00100215648BKSCISENATORE9020070913USA011321SENATORE9020070913USA011322SENATORE9020070913USA011322Structural, Syntactic, and Statistical pattern recognition1027676UNISA