01391nam2-2200409---450-99000285518020331620090717090403.01-84542-316-X000285518USA01000285518(ALEPH)000285518USA0100028551820070116h2006----km-y0itay50------baengGB||||||||001yy<<Vol.1.>> : <<The>> patent system and the measurement of inventionedited by John CantwellCheltenham [etc.]Elgar Reference Collectiocopyr. 2006XXXIII, 456 p.25 cm<<The>> international library of critical writingsin economics1972001<<The>> international library of critical writingsin economics19720010010002855162001Diritti d'autoreAnalisi economica346.048CANTWELL,JohnITsalbcISBD990002855180203316338.06 PAT 1/1 (IG I 2514/1)52487 G.IG I00119690BKGIUIANNONE9020070116USA010853IANNONE9020070116USA010855IANNONE9020070116USA010857RSIAV59020090717USA010904Patent system and the measurement of invention991812UNISA