01278nam0-22004091i-450-99000240975020331620050510134009.03-527-30458-4000240975USA01000240975(ALEPH)000240975USA0100024097520050324d2002----0engy01 baengDEa ||||0||||Surface and thin film analysisprinciples, instrumentation, applicationsedited by H. Bubert and H. JenettWeinheimJ. Wiley & Sons2002XVII, 336 p.24 cm.Film sottiliSuperficieAnalisiAnalisi spettroscopicaSpettroscopia elettronica530.417BUBERT,HenningJENETT,HolgerITDEAISBD20050310990002409750203316530.417 SUR18885 Ing.530.41700089945BKTECPATRY9020050324USA011315RENATO9020050510USA011322RENATO9020050510USA011323RENATO9020050510USA011324RENATO9020050510USA011340Surface and thin film analysis1065102UNISA