01241cam2-2200409---450-99000191569020331620121126144434.0000191569USA01000191569(ALEPH)000191569USA0100019156920040806d1968----km-y0itay50------bagrcgerCHy|||z|||001yy<<6:>> Lykon und Ariston von Keos2. ergänzte und verbesserte AuflBaselStuttgartSchwabe196867 p.25 cmTitolo della copertina0010001302512001<<Die>> Schule des AristotelesLYCO :of Troas565218ARISTO :CeusWEHRLI,Fritz RobertITsalbcISBD990001915690203316II.1.A. 166/6(IV A 1364/6)36319 L.M.II.1.XV.8. 275 6222827 L.M.XV.8.BKUMAFSOSIAV81020040806USA011824COPAT69020050530USA011048ANNAMARIA9020121123USA011036ANNAMARIA9020121126USA011444Lykon und Ariston von Keos953235UNISA01870oam 2200505zu 450 991014233230332120241212215418.097815386032391538603233(CKB)1000000000036198(SSID)ssj0000395446(PQKBManifestationID)12102724(PQKBTitleCode)TC0000395446(PQKBWorkID)10453321(PQKB)11331130(EXLCZ)99100000000003619820160829d2005 uy engtxtccr2005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan[Place of publication not identified]IEEE Computer Society2005Bibliographic Level Mode of Issuance: Monograph9780769523132 0769523137 Semiconductor storage devicesTestingCongressesRandom access memoryCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCSemiconductor storage devicesTestingRandom access memoryElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.39/732Guo li qing hua da xue (Hsinchu, Taiwan)IEEE Computer Society Technical Council on Test Technology.IEEE International Workshop on Memory Technology, Design, and TestingPQKBPROCEEDING99101423323033212005 IEEE International Workshop on Memory Technology, Design and Testing : MTDT 2005 : 3-5 August, 2005, Taipei, Taiwan2342593UNINA