01115nam--2200409---450-99000186478020331620090220154223.00-7456-2548-70-7456-2547-9000186478USA01000186478(ALEPH)000186478USA0100018647820040720d2005----km-y0enga50------baengGBy---z---001yySocial capitalDavid HalpernCambridgePolity2005XI, 388 p.24 cm20012001001------2001Capitale sociale301.18HALPERN,David67383ITsalbcISBD990001864780203316301.18 HAL 1 (IEP III 932)45370 GIEP III00130481BKECOMARIA1020040720USA011709ALINA9020041115USA011140IANNONE9020050713USA011318RSIAV49020090220USA011542Social capital956586UNISA00973nam a22002411i 450099100203453970753620040121093531.0040407s1975 it a||||||||||||||||ita b12860803-39ule_instARCHE-084042ExLDip.to Scienze StoricheitaA.t.i. Arché s.c.r.l. Pandora Sicilia s.r.l.711Bottino, Felicia283Pianificazione e assetto territoriale in Emilia Romagna /Felicia BottinoBologna :Il mulino,[1975]234 p. :ill. ;24 cmEmilia-RomagnaPiani territoriali di coordinamento.b1286080302-04-1416-04-04991002034539707536LE009 GEOG.14.415-4012009000163348le009-E0.00-l- 00000.i1342124416-04-04Pianificazione e assetto territoriale in Emilia Romagna275424UNISALENTOle00916-04-04ma -itait 0101049nam a22002651i 450099100115773970753620021001121950.0040407s1940 it a||||||||||||||||ita b12727106-39ule_instARCHE-070674ExLDip.to Scienze StoricheitaA.t.i. Arché s.c.r.l. Pandora Sicilia s.r.l.745.6Ginori Conti, Piero81064Un antifonario miniato della scuola bolognese /Piero Ginori ContiFirenze :Fondazione Ginori Conti,194072 p. :ill. ;25 cmMiniatura gotica italianaManoscritti miniatiSec. 14.Manoscritti musicaliSec. 14..b1272710602-04-1416-04-04991001157739707536LE009 LA I P 12 (Fondo Bottari)12009000230699le009-E0.00-no 00000.i1325955616-04-04Antifonario miniato della scuola bolognese131784UNISALENTOle00916-04-04ma -itait 3103487nam 2200637 450 991013234210332120230803071611.01-118-91677-81-118-91678-61-118-91676-X(CKB)3710000000224488(EBL)1770689(OCoLC)879329842(SSID)ssj0001292790(PQKBManifestationID)11765813(PQKBTitleCode)TC0001292790(PQKBWorkID)11284987(PQKB)11734331(MiAaPQ)EBC4039825(OCoLC)891400216(MiAaPQ)EBC1770689(DLC) 2014017866(Au-PeEL)EBL1770689(CaPaEBR)ebr10913519(PPN)188123830(EXLCZ)99371000000022448820140829h20142014 uy 0engur|n|---|||||txtccrSecondary ion mass spectrometry an introduction to principles and practices /Paul van der HeideHoboken, New Jersey :Wiley,2014.©20141 online resource (365 p.)THEi Wiley ebooksBibliographic Level Mode of Issuance: Monograph1-118-48048-1 1-322-07843-2 Includes bibliographical references and index.Machine generated contents note: Forward x Preface xi Acknowledgements xiv List of physical constants xiv Chapter 1: Introduction 1.1 Matter and the Mass Spectrometer 1.2 Secondary Ion Mass Spectrometry 1.3 Summary Section I Chapter 2: Properties of atoms, ions, molecules and solids 2.1 The Atom 2.2 Electronic structure of atoms and ions 2.3 Summary Chapter 3: Current understanding of sputtering and ion formation 3.1 The fundamentals of SIMS 3.2 Sputtering 3.3 Ionization/neutralization 3.4 Summary Section II Chapter 4: Instrumentation 4.1 The science of measurement 4.2 Hardware 4.3 Summary Chapter 5: Data collection 5.1 The art of measurement 5.2 Sample preparation and handling 5.3 Data collection 5.4 Data conversion 5.5 Summary Appendix i) Periodic table of the elements ii) Isotope masses, natural isotope abundances, atomic weights and mass densities of the elements iii) 1st and 2nd Ionization potentials and electron affinities of the elements iv) Work-functions of elemental solids v) SIMS detection limits of selected elements vi) Charged particle beam transport vii) Statistical properties viii) SIMS instrument designs ix) Additional SIMS methods of interest x) Additional spectrometric/spectroscopic techniques xi) Additional microscopic techniques xii) Diffraction / reflection techniques Technique acronym list Abbreviations commonly used in SIMS Glossary of terms Questions and answers References Index Notes."This is presented in a concise yet comprehensive manner to those wanting to know more about the technique in general as opposed to advanced sample specific procedures/applications"--Provided by publisher.THEi Wiley ebooks.Secondary ion mass spectrometrySecondary ion mass spectrometry.543/.65SCI013010bisacshVan der Heide Paul1962-900477MiAaPQMiAaPQMiAaPQBOOK9910132342103321Secondary ion mass spectrometry2240638UNINA