01046nam--2200349---450-99000125793020331620031112155146.0000125793USA01000125793(ALEPH)000125793USA0100012579320031112d1993----km-y0itay0103----baengUS||||||||001yyDigital integrated circuit testing from a quality perspectiveEugene R. HnatekNew YorkVan Nostrand Reinholdcopyr. 1993X, 179 p.24 cm.20012001001-------2001HNATEK,Eugene R.25686ITsalbcISBD990001257930203316621.381 548 HNA7159 Ing.HNABKTECSIAV41020031112USA011549SIAV41020031112USA011551PATRY9020040406USA011730Digital integrated circuit testing from a quality perspective986367UNISA