01152nam--2200373---450-99000119983020331620040121163206.00-471-24139-3000119983USA01000119983(ALEPH)000119983USA0100011998320031016d1998----km-y0enga50------baengUSy|||z|||001yySemiconductor material and device characterizationDieter K. Schroder2. ed.New York [etc.]A Wiley Interscience Publicationcopyr. 1998XXIV, 760 p.ill.24 cmSemiconduttori621.38152SCHRODER,Dieter K.324644ITsalbcISBD990001199830203316621.38152 SCH (A)17696 Ing.62100089355BKTECMARIA1020031016USA011313PAOLA9020040121USA011626PAOLA9020040121USA011632PATRY9020040406USA011726Semiconductor material and device characterization767613UNISA