01116nam0-22003491i-450-99000385324040332120080114112520.02-11-000254-9000385324FED01000385324(Aleph)000385324FED0100038532420030910d1979----km-y0itay50------bafreITCalcul économique et decisions publiques[Commissariat général du planJ-C. Milleron, R. Guesnerie, M. Crémieux]Paris<<La >>documentation française1979157 p.24 cmEconomie et planificationSul front. : Le volume est l'oeuvre d'un groupe de travail...Pianificazione economicaCrémieux,M.Guesnerie,R.Milleron,J-C.Francia. Commissariat Général du PLAN4161ITUNINARICAUNIMARCBK990003853240403321N/1.5 CAL/19923/ISESSESCalcul économique et decisions publiques515555UNINA01126nam--2200385---450-99000116342020331620100702151213.088-13-24012-0000116342USA01000116342(ALEPH)000116342USA0100011634220030709d2002----km-y0enga50------baitaITy|||z|||001yy<<Il>> furtoStefano TocciPadovaCedam2002IX, 321 p.24 cmEnciclopediaDiritto penale802001EnciclopediaDiritto penale80Furto345.450262TOCCI,Stefano269324ITsalbcISBD990001163420203316XXX.A. Coll. 159/ 86 (COLL HCB 80)36097 G.XXX.A. Coll. 159/ 86 (COLL HCB)00096978BKGIUMARIA1020030709USA011256RENATO9020030722USA011219PATRY9020040406USA011722RSIAV49020100702USA011512Furto679382UNISA01166nam a2200313 i 4500991001789629707536060721s2002 gw a b 001 0 eng d3540437649 (alk. paper)b13427581-39ule_instDip.to Fisicaeng620.1/129921LC TA417.2353.7.18Fultz, Brent624062Transmission electron microscopy and diffractometry of materials /Brent Fultz, James Howe2. ed.Berlin ;New York :Springer,c2002xxi, 748 p. :ill. ;24 cmIncludes bibliographical references and indexMaterialsMicroscopyTransmission electron microscopyX-ray diffractometerHowe, James M..b1342758121-09-0621-07-06991001789629707536LE006 53.7.18 FUL12006000157858le006pE82.95-l- 07970.i1427427921-07-06Transmission electron microscopy and diffractometry of materials1097557UNISALENTOle00621-07-06ma -enggw 00