01248nam--2200397---450-99000071143020331620090320120359.00-8039-7965-70071143USA010071143(ALEPH)000071143USA01007114320011030d1996----km-y0itay0103----baengGB||||||||001yyIndustrial relations in Europetraditions and transitionsedited by Joris Van Ruysseveldt and Jelle VisserLondonOpen University of the NetherlandsSAGE publications1996VIII, 424 p24 cm2001Relazioni industrialiEuropa331.094RUYSSEVELDT,Joris vanVISSER,JelleITsalbcISBD990000711430203316331.094 IND 1 (ISP IV 635)17105 GISP IV00187672BKECOPATTY9020011030USA01154020020403USA011720PATRY9020040406USA011649RSIAV29020090320USA011203RSIAV29020090320USA011203Industrial relations in Europe415390UNISA01241nam0-2200397---450 99000557665020331620190403124912.0000557665USA01000557665(ALEPH)000557665USA0100055766519981214d1991----|||y0itaa50------baspaes0 00|||Europa y el pensamiento espanol del siglo 18.Francisco Sanchez-Blanco ParodyMadridAlianza editorial1991414 p.21 cm.Alianza universidad. Ciencias sociales6862001Alianza universidad. Ciencias sociales686SPAGNASTORIASEC. 18.FSPAGNARELAZIONI CULTURALI CON L'EUROPAFMADRID946.054SANCHEZ-BLANCO,Francisco614713ITSA20111219990005576650203316Dipar.to di Filosofia - SalernoDFCC 946.054 SAN192 FILCC 946.054 SAN192 FILBKFIL20121027USA01152520121027USA011614Europa y el pensamiento espanol del siglo 181131950UNISASA000047201820aam 2200457I 450 991070958340332120140212045519.0GOVPUB-C13-1cb45ab96fd9b91901073fab856dd6db(CKB)5470000002479164(OCoLC)870343714(EXLCZ)99547000000247916420140212d2014 ua 0engrdacontentrdamediardacarrierDocumentation for Reference Material (RM) 8820 a versatile, multipurpose dimensional metrology calibration standard for scanned particle beam, scanned probe, and optical microscopy /Michael T. Postek, Andras E. Vladar, Bin Mang, Benjamin BundayGaithersburg, MD :U.S. Dept. of Commerce, National Institute of Standards and Technology,2014.1 online resource (315 pages) illustrations (black and white)NIST special publication ;1170"January 2014."Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.Title from PDF title page (viewed February 6, 2014).Includes bibliographical references.Documentation for Reference Material MetrologyMicroscopyMetrology.Microscopy.Crowley Chris J1412242Johnson Aaron N1394748Pope Jodie G1390836Wright John D174495Physical Measurement Laboratory (National Institute of Standards and Technology (U.S.))NBSNBSGPOBOOK9910709583403321Documentation for Reference Material (RM) 88203505212UNINA