01233nam--2200397---450-99000049299020331620090211141506.00049299USA010049299(ALEPH)000049299USA01004929920010604d1993----km-y0itay0103----baitaIT||||||||001yyDall'Università all'aziendaguida pratica per i neolaureatia cura di Gian Battista Rosacon il patrocinio di Confindustriain collaborazione con Corriere della Sera5. ed.MilanoACTL1993107 p.21 cm2001LaureatiOccupazioneGuide pratiche331.124ROSA,Gian BattistaConfindustriaCorriere della SeraITsalbcISBD990000492990203316331.124 DAL 2 (IRA 39/30)5081 ECIRA00012879BKECOPATTY9020010604USA01174620020403USA011658PATRY9020040406USA011634RSIAV29020090211USA011415Dall'Università all'azienda887906UNISA02072oam 2200529zu 450 991014564720332120241212215426.097815090954831509095489(CKB)1000000000278241(SSID)ssj0000394148(PQKBManifestationID)12102347(PQKBTitleCode)TC0000394148(PQKBWorkID)10386669(PQKB)10519948(EXLCZ)99100000000027824120160829d2006 uy engtxtccr2006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology : IEEE DTIS 2006 : September 05-07, 2006, Tunis, Tunisia : proceedings[Place of publication not identified]Institute of Electrical and Electronics Engineers2006Bibliographic Level Mode of Issuance: Monograph9780780397262 0780397266 Integrated circuitsDesign and constructionCongressesIntegrated circuitsTestingCongressesNanotechnologyDesignCongressesMicroelectronicsCongressesElectrical & Computer EngineeringHILCCElectrical EngineeringHILCCEngineering & Applied SciencesHILCCIntegrated circuitsDesign and constructionIntegrated circuitsTestingNanotechnologyDesignMicroelectronicsElectrical & Computer EngineeringElectrical EngineeringEngineering & Applied SciencesGirard PatrickInternational Conference on Design & Test of Integrated Systems in Nanoscale Technology.PQKBPROCEEDING99101456472033212006 International Conference on Design & Test of Integrated Systems in Nanoscale Technology : IEEE DTIS 2006 : September 05-07, 2006, Tunis, Tunisia : proceedings2506700UNINA