01045nam0-2200349li-450 99000017480020331620180312154651.00-7923-9475-50017480USA010017480(ALEPH)000017480USA01001748020001109d1994----km-y0itay0103----baengUSSystem test and diagnosisWilliam R. Simpson and John W. SheppardBoston [etc.]Kluwercopyr. 1994circuiti elettronici valutazione620.0044Prove e misureSimpson,William R.50595Sheppard,John W.Sistema bibliotecario di Ateneo dell' Università di SalernoRICA990000174800203316620.004 4 SIM0006779BKTEC1996032520001110USA01171320020403USA011625PATRY9020040406USA011613System test and diagnosis1488429UNISA