01107nam0-2200361li-450 99000017047020331620180312154902.00-387-94541-50017047USA010017047(ALEPH)000017047USA01001704720001109d1995----km-y0itay0103----baengGEQuantitative X-ray diffractometryLev S. Zevin, Giora Kimmeledited by Inez MureinikBerlin [etc.]Springer-Verlagcopyr. 1995diffrazione dei raggi x applicazione nel545.81Metodi otticiZevin,Lev S.754961Kimmel,GioraMureinik,InezSistema bibliotecario di Ateneo dell' Università di SalernoRICA990000170470203316545.81 ZEV0007658BKTEC1996112620001110USA01171220020403USA011624PATRY9020040406USA011612Quantitative X-ray diffractometry1519464UNISA