01307nam2-2200385li-450 99000010911020331620180312154733.00-8247-7668-20010911USA010010911(ALEPH)000010911USA01001091120001109d1987----km-y0itay0103----baengUSIntegrated circuit quality and reliabilityEugene R. HnatekNew York [etc.]Marcell Dekkercopyr. 1987XIII, 698 p.ill.23 cmElectrical engineering and electronics4100100109122001Electrical engineering and electronicsa series of reference books and textbooksMarlin O. Thurston, William Middendorf, editorsaffidabilita' (ingegneria)circuiti integrati621381.Hnatek,Eugene R.25686Sistema bibliotecario di Ateneo dell' Università di SalernoRICA990000109110203316621.381 HNA0001023BKTEC1991062020001110USA01171120020403USA011618PATRY9020040406USA011608Integrated circuit quality and reliability1491784UNISA