01590nam0-2200517---450-990000065630203316200005220-471-98502-30006563USA010006563(ALEPH)000006563USA01000656320000522d1999----|||y0itay0103----baEngUS||||||||001yyMicrostructural characterization of materialsDavid Brandon and Wayne D. KaplanChichesterJohn Wiley & sons1999XIII, 409 p.23 cm.MaterialiProprietáMicrostruttura620.11299BRANDON,David747018KAPLAN,Wayne D.747019ITSALBCISBD990000065630203316620.11299 BRA13597 ING620.1129900001084620.11299 BRA13345 ING620.11299 BRABKTEC20000914USA01173020001019USA01105520001019USA01145320001019USA01150020001019USA01153820001024USA01151420001027USA01151820001027USA01152220001110USA01170920001124USA011207PATTY9020010515USA011252PATTY9020010515USA01125520020403USA011614PATRY9020040406USA011606Microstructural characterization of materials1491774UNISA