01834nam--22005411i-450-99000001925020331620051021094733.00-674-99015-30-674-99060-90-674-99144-30-674-99179-60-674-99333-00-674-99474-40-674-99475-20001925USA010001925(ALEPH)000001925USA01000192520000914d1913193619881998????|||y0itay0103----baita||||||||001yyLucianenglish translation by Harmon, A.M. , Kilburn, K. , Macleod, M.D.CambridgeHarvard University1913-1936 (stampa 1988-1998)8 v.17 cm.(Loeb classical library14, 54, 130, 162, 302, 430-432Testo orig. a fronte888.01HARMON,A.M.KILBURN,K.MACLEOD,M.D.LUCIANUS753890990000019250203316V.1. Coll.7/ 33/1(VIII A 972 LUC / 1 )148918 L.M.V.1. Coll.7/ 33/2(VIII A 972 LUC /2)148957 L.M.VIII AV.1. Coll.7/ 33/3(VIII A 972 LUC /3)149025 L.M.VIII ABKuma20000914USA01171020000919USA01104620000919USA01151920001019USA01105320001019USA01145120001019USA01145820001019USA01153620001024USA01151120001027USA01152020001110USA01170820001124USA011205PATRY9020010713USA01123720020403USA011609PATRY9020040406USA011603COPAT39020051021USA010947Lucian1516664UNISA01834oam 2200517zu 450 99621125880331620210807003423.0(CKB)111055184256788(SSID)ssj0000527249(PQKBManifestationID)12175703(PQKBTitleCode)TC0000527249(PQKBWorkID)10524982(PQKB)11652419(EXLCZ)9911105518425678820160829d2002 uy engtxtccrProceedings International Test Conference 2002[Place of publication not identified]International Test Conference2002Bibliographic Level Mode of Issuance: Monograph0-7803-7542-4 Integrated circuitsTestingCongressesElectronic digital computersTestingCircuitsCongressesTelecommunicationCongressesRadio frequencyCongressesElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCIntegrated circuitsTestingElectronic digital computersTestingCircuitsTelecommunicationRadio frequencyElectrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.3815/48IEEE Computer Society Test Technology Technical CommitteeInstitute of Electrical and Electronics Engineers Philadelphia Section.International Test ConferencePQKBPROCEEDING996211258803316Proceedings International Test Conference 20022506427UNISA