00920nam2 2200277 450 00003177020220113132601.020171205d1969----km-y0itay50------baengUSy-------001yyElectron probe microanalysisedited by A. J. Tousimis and L. MartonNew YorkLondonAcademic press1969XII, 450 p.ill.25 cm0010000317582001Advances in electronics and electron physicsElectron probe microanalysis1499732SondeMicroanalisiMetallurgiaMicroanalisi621.38114ElettronicaTousimis,A. J.Marton,L.ITUNIPARTHENOPE20171205REICATUNIMARC000031770P1 AEP 537.5/6 [3]11873PIST2017Electron probe microanalysis1499732UNIPARTHENOPE