01255nam0 22003251i 450 UON0050295820231205105423.18978-01-956502-5-920200220d2000 |0itac50 baengUS|||| |||||Epic threadsJohn Brockington on the Sanskrit epicsedited by Greg Bailey and Mary Brockington OxfordOxford University Press2000xxxi, 359 p.22 cmMahābhārataInterpretazione e criticaUONC085954FIPOESIA EPICA SANSCRITAStoria e criticaUONC096733FIVālmīki RāmāyanạUONC096732FIGBOxfordUONL000029891.2Letteratura sanscrita22BAILEYGregUONV005575BROCKINGTONMaryUONV244382Oxford University PressUONV245947650ITSOL20250801RICASIBA - SISTEMA BIBLIOTECARIO DI ATENEOUONSIUON00502958SIBA - SISTEMA BIBLIOTECARIO DI ATENEOSI SI SHIVA 101 SI 35116 7 101 Epic threads1732366UNIOR103413oas 22011773a 450 991062614770332120260127110658.01558-1918(DE-599)ZDB2028644-2(OCoLC)44506975(CONSER) 2005215229(CKB)954925539157(DE-599)2028644-2(EXLCZ)9995492553915720000629b19842012 sy aengurcn|||||||||txtrdacontentcrdamediacrrdacarrierIEEE design & test of computers /IEEE Computer Society [and] the Institute of Electrical and Electronics Engineers, IncLos Alamitos, CA IEEE Computer Society1984-2012Refereed/Peer-reviewed0740-7475 IEEE design and test of computersDesign & test of computersDesign and test of computersIEEE design and testDesign & test of computers, IEEEIEEE design & testIEEE des. test comput.Computer engineeringPeriodicalsElectronic digital computersTestingPeriodicalsOrdinateursConception et constructionPériodiquesOrdinateursEssaisPériodiquesOrdinateursConception et constructionPériodiquesComputer engineeringfast(OCoLC)fst00872078Electronic digital computersTestingfast(OCoLC)fst00907175DatenverarbeitungssystemgndLeistungsbewertunggndZeitschriftgndOnline-RessourcegndTestengndDatenverarbeitunggndComputergndEntwurfgndPeriodicals.fastPeriodicals.lcgftComputer engineeringElectronic digital computersTestingOrdinateursConception et constructionPériodiques.OrdinateursEssaisPériodiques.OrdinateursConception et constructionComputer engineering.Electronic digital computersTesting.DatenverarbeitungssystemLeistungsbewertungZeitschrift.Online-RessourceTestenDatenverarbeitungComputerEntwurf621.39IEEE Computer SocietyInstitute of Electrical and Electronics EngineersNTDNTDOCLOCLCQNSDIULU9SOCLCQHEBISOCLCQMYGBUFOCLCFTXAOCLCQDEFHMOCLCOOCLCAAU@UKMGBOCLCAVT2OCLCAOCLCOOCLCQUABHNCAUDOCLCAOCLCLOCLCQJOURNAL9910626147703321IEEE design & test of computers2576261UNINA