03793nam 2200649 450 991078895260332120230803201220.01-5231-0050-83-11-037692-X3-11-028811-710.1515/9783110288117(CKB)3390000000062014(EBL)1139070(SSID)ssj0001406678(PQKBManifestationID)12546441(PQKBTitleCode)TC0001406678(PQKBWorkID)11401536(PQKB)11730128(MiAaPQ)EBC1139070(DE-B1597)179413(OCoLC)903310232(OCoLC)939903573(DE-B1597)9783110288117(Au-PeEL)EBL1139070(CaPaEBR)ebr11082658(CaONFJC)MIL810142(OCoLC)900093301(EXLCZ)99339000000006201420140226h20142014 uy| 0engur|nu---|u||utxtccrPolymer surface characterization /edited by Luigia SabbatiniBerlin ;Boston :De Gruyter,[2014]©20141 online resource (308 p.)De Gruyter graduateDescription based upon print version of record.3-11-027508-2 Includes bibliographical references and index.Front matter --Preface --Contents --Contributing authors --1. Introductory remarks on polymers and polymer surfaces /Cometa, Stefania / Sabbatini, Luigia --2. Investigation of polymer surfaces by time-of-flight secondary ion mass spectrometry /Keller, Beat A. --3. Polymer surface chemistry: Characterization by XPS /Giglio, Elvira De / Ditaranto, Nicoletta / Sabbatini, Luigia --4. Attenuated total reflection-Fourier transform infrared spectroscopy: A powerful tool for investigating polymer surfaces and interfaces /Mangolini, Filippo / Rossi, Antonella --5. Scanning probe microscopy of polymers /Yablon, Dalia --6. Polymer surface morphology: Characterization by electron microscopies /Šlouf, Miroslav / Vacková, Tatana / Lednický, František / Wandrol, Petr --7. Wettability: Significance and measurement /Palumbo, Fabio / Mundo, Rosa Di --8. Advances of spectroscopic ellipsometry in the analysis of thin polymer films-polymer interfaces /Bittrich, Eva / Eichhorn, Klaus-Jochen --IndexPolymer Surface Characterization provides a comprehensive approach to the surface analysis of polymers of technological interest by means of modern analytical techniques. Basic principles, operative conditions, applications, performance, and limiting features are supplied, together with current advances in instrumental apparatus. Each chapter is devoted to one technique and is self-consistent; the end-of-chapter references would allow the reader a quick access to more detailed information. After an introductory chapter, techniques that can interrogate the very shallow depth of a polymer surface, spanning from the top few angstroms in secondary ions mass spectrometry to 2-10 nm in X-ray photoelectron spectroscopy are discussed, followed by Fourier transform infrared spectroscopy and chapters on characterization by scanning probe microscopy, electron microscopies, wettability and spectroscopic ellipsometry.De Gruyter graduate.PolymersSurfacesAnalysisPolymersSurfacesAnalysis.547/.70453VE 8000rvkSabbatini LuigiaMiAaPQMiAaPQMiAaPQBOOK9910788952603321Polymer surface characterization3673251UNINA01199nam2 22002771i 450 UON0005051220231205102223.96520020107d1978 |0itac50 barusSU|||| 1||||Paleoantropologija zemnogo sara i formirovanie celovceskih rasPaleolitV.P. AlekseevMoskvaIzd. Nauka1978282 p.24 cm001UON000474352001 Istorija krest'janstva Sibiri210 NovosibirskIzd. Nauka Sibirskoe Otdelenie19-215 v.26 cmPALEOANTROPOLOGIAUONC017301FIRUMoskvaUONL003152IG XINTERESSE GENERALE - ARCHEOLOGIAAALEKSEEVValerij PavlovicUONV008456635270Akademija Nauk SSSRUONV247334650ITSOL20241213RICASIBA - SISTEMA BIBLIOTECARIO DI ATENEOUONSIUON00050512SIBA - SISTEMA BIBLIOTECARIO DI ATENEOSI IG X 058 SI SA 34210 7 058 Paleoantropologija zemnogo sara i formirovanie celovceskih ras1208275UNIOR