01281oam 2200397zu 450 991087267550332120241212214848.0(CKB)111026746716012(SSID)ssj0000454970(PQKBManifestationID)12175360(PQKBTitleCode)TC0000454970(PQKBWorkID)10399399(PQKB)10059593(NjHacI)99111026746716012(EXLCZ)9911102674671601220160829d1997 uy engur|||||||||||txtccr1997 IEEE International Conference on Microelectronic Test Structures Proceedings[Place of publication not identified]IEEE19971 online resource (200 pages)Bibliographic Level Mode of Issuance: Monograph9780780332430 0780332431 Integrated circuitsTestingIntegrated circuitsTesting.621.3815IEEE, Institute of Electrical and Electronics Engineers, Inc. StaffPQKBBOOK99108726755033211997 IEEE International Conference on Microelectronic Test Structures Proceedings2525485UNINA01004nam0 22002771i 450 UON0004158020231205102148.41520020107d1958 |0itac50 bafreFR|||| 1||||ˆLe ‰Saharapar Jean LartéguyParisHachette195864 p.ill.24 cm001UON000415812001 Encyclopaedie par l'imageSAHARAGeografiaUONC014151FIFRParisUONL002984ARA VIII APAESI ARABI - GEOGRAFIA E VIAGGI - GEOGRAFIAALarteguyJeanUONV026451648110HachetteUONV247610650ITSOL20250919RICASIBA - SISTEMA BIBLIOTECARIO DI ATENEOUONSIUON00041580SIBA - SISTEMA BIBLIOTECARIO DI ATENEOSI ARA VIII A 031 SI MR 62175 7 031 Sahara1152228UNIOR