02732nam 2200661Ia 450 991102038000332120200520144314.09786611764258978128176425612817642569783527613748352761374997835276137553527613757(CKB)1000000000377522(EBL)482155(OCoLC)261345508(SSID)ssj0000275599(PQKBManifestationID)11229914(PQKBTitleCode)TC0000275599(PQKBWorkID)10222806(PQKB)11041685(MiAaPQ)EBC482155(Perlego)2789575(EXLCZ)99100000000037752219990502d1999 uys 0engur|n|---|||||txtccrX-ray characterization of materials /Eric Lifshin (ed.)Weinheim ;New York Wiley-VCH19991 online resource (280 p.)Description based upon print version of record.9783527296576 3527296573 Includes bibliographical references and index.X-ray Characterization of Materials; Contents; List of Symbols and Abbreviations.; 1 X-Ray Diffraction; 2 Application of Synchrotron X-Radiation to Problems in Materials Science; 3 X-Ray Fluorescence Analysis; 4 Small-Angle Scattering of X-Rays and Neutrons; IndexLinking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental compositX-ray spectroscopyMaterialsAnalysisSurfaces (Technology)AnalysisX-raysIndustrial applicationsX-ray spectroscopy.MaterialsAnalysis.Surfaces (Technology)Analysis.X-raysIndustrial applications.620.11272778.33Lifshin Eric1840300MiAaPQMiAaPQMiAaPQBOOK9911020380003321X-ray characterization of materials4419846UNINA