02297oam 2200649zu 450 991102025120332120251116150842.01-280-55472-X97866105547200-470-85212-70-470-84605-4(CKB)1000000000019116(SSID)ssj0000080419(PQKBManifestationID)11121087(PQKBTitleCode)TC0000080419(PQKBWorkID)10095742(PQKB)11490218(MiAaPQ)EBC4956469(Au-PeEL)EBL4956469(CaONFJC)MIL55472(OCoLC)53468482(EXLCZ)99100000000001911620160829d2002 uy engurcnu||||||||txtccrESD in silicon integrated circuits2nd ed.[Place of publication not identified]J Wiley20021 online resource (421 pages)Bibliographic Level Mode of Issuance: Monograph0-471-49871-8 Electrostatic discharge (ESD) effects in silicon integrated circuits have become a major concern as high circuit density technologies shrink to sub-micron dimensions. This update of a classic reference provides a complete and current overview of ESD and its implications in the design and development of new semiconductor technologies and integrated circuits.SemiconductorsProtectionIntegrated circuitsProtectionElectrostaticsStatic eliminatorsElectrical & Computer EngineeringHILCCEngineering & Applied SciencesHILCCElectrical EngineeringHILCCSemiconductorsProtection.Integrated circuitsProtection.Electrostatics.Static eliminators.Electrical & Computer EngineeringEngineering & Applied SciencesElectrical Engineering621.3815/2Amerasekera E. A.1841869Duvvury CharvakaPQKBBOOK9911020251203321ESD in silicon integrated circuits4421750UNINA