01330cam2-2200349---450-99000866575040332120080530130354.0000866575FED01000866575(Aleph)000866575FED0100086657520080528g19489999km-y0itay50------bagerDEy-------001yy[Schriften][Martin Luther]Unveränd. AbdruckWeimarBohlaus Nachfolger1948-GrazAkademische Druck- u. Verlagsanstalt81 v.26 cmRipr. dell'ed.: Weimar : H. Böhlaus, 1883-1912Bd. 15 : Personen und OrtsregisterBd. 18 : Alphabetisches Verzeichnis der Textanfange [...]Bd. 30.2; 30.3; 32; 33; 41; 48: RevisionsnachtrageBd. 55 [erste Abt., erster Tl., zweite Lief.; zweite Abt., erster Tl., zweite Lief.Bd. 58.1: GesamtregisterBd. 62, Ortsregister0010004283422001D. Martin Luthers Werke1. sezioneLutero, MartinoOpereEdizione critica284.1092Luther,Martin<1483-1546>127546ITUNINARICAUNIMARCBK990008665750403321284.1092 LUT 30 (1/64)43438 Bibl.FLFBCFLFBCSchriften717669UNINA02359nam 22004935 450 991035027070332120250619004720.0981-13-6854-610.1007/978-981-13-6854-7(CKB)4100000009158742(DE-He213)978-981-13-6854-7(MiAaPQ)EBC5721655(EXLCZ)99410000000915874220190301d2019 u| 0engurnn|008mamaatxtrdacontentcrdamediacrrdacarrierParticle Verbs in English A Cognitive Linguistic Perspective /by Han Luo1st ed. 2019.Singapore :Springer Nature Singapore :Imprint: Springer,2019.1 online resource (XVII, 180 p. 34 illus.) 981-13-6853-8 1 Introduction -- 2 Theoretical Framework -- 3 The Conceptual Content of Particle Verb Schemas -- 4 Particle Placement -- 5 Idomaticity and Semantic Extension -- 6 Conclusion and Outlook. .This book explains why cognitive linguistics offers a plausible theoretical framework for a systematic and unified analysis of the syntax and semantics of particle verbs. It explores the meaning of the verb + particle syntax, the particle placement of transitive particle verbs, how particle placement is related to idiomaticity, and the relationship between idiomaticity and semantic extension. It also offers valuable linguistic implications for future studies on complex linguistic constructions using a cognitive linguistic approach, as well as insightful practical implications for the learning and teaching of English particle verbs. .PsycholinguisticsSemioticsGrammar, Comparative and generalSyntaxPsycholinguistics and Cognitive LingusiticsSemioticsSyntaxPsycholinguistics.Semiotics.Grammar, Comparative and generalSyntax.Psycholinguistics and Cognitive Lingusitics.Semiotics.Syntax.410.1835Luo Hanauthttp://id.loc.gov/vocabulary/relators/aut1058896BOOK9910350270703321Particle Verbs in English2503075UNINA06076nam 2200829 a 450 991101968310332120200520144314.097866130723689781283072366128307236X9780470886656047088665X9780470886793047088679X9780470950012047095001397804708867860470886781(CKB)2550000000032153(EBL)698705(SSID)ssj0000482387(PQKBManifestationID)11306136(PQKBTitleCode)TC0000482387(PQKBWorkID)10524996(PQKB)10724093(MiAaPQ)EBC698705(PPN)17022449X(PPN)156594846(OCoLC)714797067(FR-PaCSA)88803209(FRCYB88803209)88803209(Perlego)1012431(EXLCZ)99255000000003215320100723d2010 uy 0engur|n|---|||||txtccrStructural dynamics of electronic and photonic systems /edited by Ephraim Suhir, David S. Steinberg, T.X. YuHoboken, N.J. Wiley20101 online resource (610 p.)Includes index.9780470250020 047025002X Structural Dynamics of Electronic and Photonic Systems; Contents; Preface; Contributors; 1 Some Major Structural Dynamics-Related Failure Modes and Mechanisms in Micro- and Opto-Electronic Systems and Dynamic Stability of These Systems; 2 Linear Response to Shocks and Vibrations; 3 Linear and Nonlinear Vibrations Caused by Periodic Impulses; 4 Random Vibrations of Structural Elements in Electronic and Photonic Systems; 5 Natural Frequencies and Failure Mechanisms of Electronic and Photonic Structures Subjected to Sinusoidal or Random Vibrations6 Drop/Impact of Typical Portable Electronic Devices: Experimentation and Modeling7 Shock Test Methods and Test Standards for Portable Electronic Devices; 8 Dynamic Response of Solder Joint Interconnections to Vibration and Shock; 9 Test Equipment, Test Methods, Test Fixtures, and Test Sensors for Evaluating Electronic Equipment; 10 Correlation between Package-Level High-Speed Solder Ball Shear/Pull and Board-Level Mechanical Drop Tests with Brittle Fracture Failure Mode, Strength, and Energy11 Dynamic Mechanical Properties and Microstructural Studies of Lead-Free Solders in Electronic Packaging12 Fatigue Damage Evaluation for Microelectronic Components Subjected to Vibration; 13 Vibration Considerations for Sensitive Research and Production Facilities; 14 Applications of Finite Element Analysis: Attributes and Challenges; 15 Shock Simulation of Drop Test of Hard Disk Drives; 16 Shock Protection of Portable Electronic Devices Using a "Cushion" of an Array of Wires (AOW); 17 Board-Level Reliability of Lead-Free Solder under Mechanical Shock and Vibration Loads18 Dynamic Response of PCB Structures to Shock Loading in Reliability Tests19 Linear Response of Single-Degree-of-Freedom System to Impact Load: Could Shock Tests Adequately Mimic Drop Test Conditions?; 20 Shock Isolation of Micromachined Device for High-g Applications; 21 Reliability Assessment of Microelectronics Packages Using Dynamic Testing Methods; 22 Thermal Cycle and Vibration/Drop Reliability of Area Array Package Assemblies; 23 Could an Impact Load of Finite Duration Be Substituted with an Instantaneous Impulse?; Index"The proposed book will offer comprehensive and versatile methodologies and recommendations on how to determine dynamic characteristics of typical micro- and opto-electronic structural elements (printed circuit boards, solder joints, heavy devices, etc.) and how to design a viable and reliable structure that would be able to withstand high-level dynamic loading. Particular attention will be given to portable devices and systems designed for operation in harsh environments (such as automotive, aerospace, military, etc.) In-depth discussion from a mechanical engineer's viewpoint will be conducted to the key components' level as well as the whole device level. Both theoretical (analytical and computer-aided) and experimental methods of analysis will be addressed. The authors will identify how the failure control parameters (e.g. displacement, strain and stress) of the vulnerable components may be affected by the external vibration or shock loading, as well as by the internal parameters of the infrastructure of the device. Guidelines for material selection, effective protection and test methods will be developed for engineering practice"--Provided by publisher."The proposed book will offer comprehensive and versatile methodologies and recommendations on how to determine dynamic characteristics of typical micro- and opto-electronic structural elements (printed circuit boards, solder joints, heavy devices, etc.) and how to design a viable and reliable structure that would be able to withstand high-level dynamic loading"--Provided by publisher.Electronic apparatus and appliancesReliabilityOptoelectronic devicesReliabilityFault tolerance (Engineering)MicrostructureStructural dynamicsElectronic apparatus and appliancesReliability.Optoelectronic devicesReliability.Fault tolerance (Engineering)Microstructure.Structural dynamics.621.382Suhir Ephraim1840398Yu T. X(Tongxi),1941-1604361Steinberg David S43610MiAaPQMiAaPQMiAaPQBOOK9911019683103321Structural dynamics of electronic and photonic systems4419923UNINA