01076nam--2200373---450-99000608321020331620151007123420.0000608321USA01000608321(ALEPH)000608321USA0100060832120151007d1983----km-y0itay50------baitaIT||||||||001yy<<Gli>> Aurunci nella Campania Felixstoria e monetazioneBeniamino PetterutiSessa Aurunca[s.n.]1983La PoligraficaGaeta221 p.24 cm20012001001-------2001Campania - Storia930.1PETTERUTI,Beniamino714795ITsalbcISBDUNIMARC990006083210203316XV.3. 1609XV.3BKPAPBOCCONE0020151007USA011224BOCCONE0020151007USA011229BOCCONE0020151007USA011234Aurunci nella Campania Felix1382374UNISA05946nam 22008533u 450 991101921090332120230120025610.09786612342943978128234294112823429409780470727126047072712897804707271330470727136(CKB)1000000000520026(EBL)470287(OCoLC)232611467(SSID)ssj0000303232(PQKBManifestationID)11210476(PQKBTitleCode)TC0000303232(PQKBWorkID)10275320(PQKB)10373254(MiAaPQ)EBC470287(MiAaPQ)EBC6992864(Perlego)2764158(EXLCZ)99100000000052002620160215d2008|||| u|| |engur|n|---|||||txtccrMicrostructural Characterization of Materials2nd ed.Hoboken Wiley20081 online resource (554 p.)Quantitative software engineering series Microstructural characterization of materialsDescription based upon print version of record.9780470027844 0470027843 Microstructural Characterization of Materials; Contents; Preface to the Second Edition; Preface to the First Edition; 1 The Concept of Microstructure; 1.1 Microstructural Features; 1.1.1 Structure-Property Relationships; 1.1.2 Microstructural Scale; 1.1.3 Microstructural Parameters; 1.2 Crystallography and Crystal Structure; 1.2.1 Interatomic Bonding in Solids; 1.2.2 Crystalline and Amorphous Phases; 1.2.3 The Crystal Lattice; Summary; Bibliography; Worked Examples; Problems; 2 Diffraction Analysis of Crystal Structure; 2.1 Scattering of Radiation by Crystals2.1.1 The Laue Equations and Bragg's Law2.1.2 Allowed and Forbidden Reflections; 2.2 Reciprocal Space; 2.2.1 The Limiting Sphere Construction; 2.2.2 Vector Representation of Bragg's Law; 2.2.3 The Reciprocal Lattice; 2.3 X-Ray Diffraction Methods; 2.3.1 The X-Ray Diffractometer; 2.3.2 Powder Diffraction-Particles and Polycrystals; 2.3.3 Single Crystal Laue Diffraction; 2.3.4 Rotating Single Crystal Methods; 2.4 Diffraction Analysis; 2.4.1 Atomic Scattering Factors; 2.4.2 Scattering by the Unit Cell; 2.4.3 The Structure Factor in the Complex Plane2.4.4 Interpretation of Diffracted Intensities2.4.5 Errors and Assumptions; 2.5 Electron Diffraction; 2.5.1 Wave Properties of Electrons; 2.5.2 Ring Patterns, Spot Patterns and Laue Zones; 2.5.3 Kikuchi Patterns and Their Interpretation; Summary; Bibliography; Worked Examples; Problems; 3 Optical Microscopy; 3.1 Geometrical Optics; 3.1.1 Optical Image Formation; 3.1.2 Resolution in the Optical Microscope; 3.1.3 Depth of Field and Depth of Focus; 3.2 Construction of the Microscope; 3.2.1 Light Sources and Condenser Systems; 3.2.2 The Specimen Stage; 3.2.3 Selection of Objective Lenses3.2.4 Image Observation and Recording3.3 Specimen Preparation; 3.3.1 Sampling and Sectioning; 3.3.2 Mounting and Grinding; 3.3.3 Polishing and Etching Methods; 3.4 Image Contrast; 3.4.1 Reflection and Absorption of Light; 3.4.2 Bright-Field and Dark-Field Image Contrast; 3.4.3 Confocal Microscopy; 3.4.4 Interference Contrast and Interference Microscopy; 3.4.5 Optical Anisotropy and Polarized Light; 3.4.6 Phase Contrast Microscopy; 3.5 Working with Digital Images; 3.5.1 Data Collection and The Optical System; 3.5.2 Data Processing and Analysis; 3.5.3 Data Storage and Presentation3.5.4 Dynamic Range and Digital Storage3.6 Resolution, Contrast and Image Interpretation; Summary; Bibliography; Worked Examples; Problems; 4 Transmission Electron Microscopy; 4.1 Basic Principles; 4.1.1 Wave Properties of Electrons; 4.1.2 Resolution Limitations and Lens Aberrations; 4.1.3 Comparative Performance of Transmission and Scanning Electron Microscopy; 4.2 Specimen Preparation; 4.2.1 Mechanical Thinning; 4.2.2 Electrochemical Thinning; 4.2.3 Ion Milling; 4.2.4 Sputter Coating and Carbon Coating; 4.2.5 Replica Methods; 4.3 The Origin of Contrast; 4.3.1 Mass-Thickness Contrast4.3.2 Diffraction Contrast and Crystal Lattice DefectsMicrostructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy.<br /> <br /> <i>Microstructural Characterization of Materials, 2nd Edition</i> is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental metElectronic books. -- localMaterials -- MicroscopyMicrostructureMaterialsMicroscopyMicrostructureMaterials ScienceHILCCChemical & Materials EngineeringHILCCEngineering & Applied SciencesHILCCElectronic books. -- local.Materials -- Microscopy.Microstructure.MaterialsMicroscopy.Microstructure.Materials ScienceChemical & Materials EngineeringEngineering & Applied Sciences620.1/1299Brandon David747018Kaplan Wayne D747019Brandon D. G1838783AU-PeELAU-PeELAU-PeELBOOK9911019210903321Microstructural Characterization of Materials4417852UNINA