03134nam 2200589 a 450 991101909970332120200520144314.09786611842550978128184255812818425599783527614561352761456797835276145543527614559(CKB)1000000000377543(EBL)481519(SSID)ssj0000145149(PQKBManifestationID)11163577(PQKBTitleCode)TC0000145149(PQKBWorkID)10156196(PQKB)10409477(MiAaPQ)EBC481519(OCoLC)212132231(Perlego)2758695(EXLCZ)99100000000037754320120114d1997 uy 0engur|n|---|||||txtccrElectron microscopy principles and fundamentals /edited by S. Amelinckx ... [et al.]Weinheim [Germany] VCH, a Wiley Co.19971 online resource (529 p.)Description based upon print version of record.9783527294794 3527294791 Includes bibliographical references and index.Electron Microscopy Principles and Fundamentals; Contents; Introduction; 1 Stationary Beam Methods; 1.1 Transmission Electron Microscopy; 1.1.1 Diffraction Contrast Transmission Electron Microscopy; 1.1.2 High-Resolution Electron Microscopy; 1.2 Reflection Electron Microscopy; 1.3 Electron Energy-Loss Spectroscopy Imaging; 1.4 High Voltage Electron Microscopy; 1.5 Convergent Beam Electron Diffraction; 1.6 Low-Energy Electron Microscopy; 1.7 Lorentz Microscopy; 1.8 Electron Holography Methods; 1.9 Spin-Polarized Low-Energy; 2 Scanning Beam Methods; 2.1 Scanning Reflection Electron Microscopy2.2 Scanning Transmission Electron Microscopy2.3 Scanning-Transmission Electron Microscopy : Z Contrast; 2.4 Scanning Auger Microscopy (SAM) and Imaging X-Ray Photoelectron Microscopy (XPS); 2.5 Scanning Microanalysis; 2.6 Imaging Secondary Ion Mass Spectrometry; 2.7 Scanning Electron Microscopy with Polarization Analysis (SEMPA); IndexDerived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research.Topics include:* Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic MetElectron microscopyElectron microscopy.502.825Amelinckx S50786MiAaPQMiAaPQMiAaPQBOOK9911019099703321Electron microscopy4421306UNINA