02742nam 22005534a 450 991100688290332120200520144314.01-281-97132-497866119713281-61583-316-11-84919-001-1(CKB)1000000000692747(EBL)407960(OCoLC)437247405(SSID)ssj0000293996(PQKBManifestationID)11195924(PQKBTitleCode)TC0000293996(PQKBWorkID)10303730(PQKB)11558122(MiAaPQ)EBC407960(EXLCZ)99100000000069274720061011d2003 uy 0engur|n|---|||||txtccrDigital and analogue instrumentation testing and measurement /Nihal KularatnaLondon Institution of Electrical Engineersc20031 online resource (677 p.)IEE electrical measurement series ;v. 11Description based upon print version of record.0-85296-999-6 Includes bibliographical references and index.Introduction -- Enabling technologies -- Data converters -- Waveform parameters, multimeters and pulse techniques -- Fundamentals of oscilloscopes -- Recent developments on DSO techniques -- Electronic counters -- Conventional signal sources and arbitrary waveform generators -- Spectrum analysis -- Logic analysers -- An introduction to instrument buses and VLSI testing -- Transmission measurements -- Digital signal processors -- Sensors -- Calibration of instruments.A substantial update of his earlier book ""Modern Electronic Test and Measuring Instruments"" (IEE, 1996), the author provides a state-of-the art review of modern families of digital instruments. For each family he covers internal design, use and applications, highlighting their advantages and limitations from a practical application viewpoint. New enabling semiconductor technology including data converters, signal processors and modern sensors offers new capabilities to instrument designers and the book treats new digital instrument families such as DSOs, Arbitrary Function Generators, FFT anIEE electrical measurement series ;11.Electronic instrumentsTestingElectronic instrumentsTesting.621.381548Kularatna Nihal903313Institution of Electrical Engineers.MiAaPQMiAaPQMiAaPQBOOK9911006882903321Digital and analogue instrumentation4391846UNINA