01180nam a2200265Ia 4500991001441419707536111019s 000 0 eng d1901903028b14014981-39ule_instDip.to Filologia Ling. e Lett.itaCobbing, Andrew475937Kawada Ryōkichi - Jeanie Eadie's samurai :the life and times of a Meiji entrepreneur and agricultural pioneer /by Andrew Cobbing and Itami Masatarō.Folkestone, Kent :Global Oriental,2006xi, 288 p. :ill. , maps ;23 cm.Include bibliografia Kawada, RyōkichiAgricolturaGiapponeStoria GiapponeStoriaPeriodo Meiji, 1868-1912.Itami, Masatarōauthorhttp://id.loc.gov/vocabulary/relators/aut731812.b1401498102-04-1419-10-11991001441419707536LE008 FL.M. (Giapp.) C 3412008000444754le008gE0.00-l- 01010.i1533585919-10-11Kawada Ryōkichi - Jeanie Eadie's samurai1441831UNISALENTOle00819-10-11ma -engenk0003516nam 2200589 450 991079827670332120170919162608.01-63076-114-1(CKB)3710000000610679(EBL)4428213(OCoLC)931226973(SSID)ssj0001624739(PQKBManifestationID)16360242(PQKBTitleCode)TC0001624739(PQKBWorkID)14879692(PQKB)10703531(PQKBManifestationID)16282290(PQKBWorkID)14879693(PQKB)20547674(MiAaPQ)EBC4428213(EXLCZ)99371000000061067920151130h20162016 uy| 0engur|n|---|||||txtccrX child stars where are they now? /by Kathy Garver and Fred AscherLanham :Taylor Trade Publishing,[2016]©20161 online resource (369 p.)Includes index.1-63076-113-3 Contents; Foreword; Introduction; THE 1950s; I Love Lucy/The Lucy-Desi Comedy Hour; The Adventures of Ozzie and Harriet; Our Miss Brooks; The Life of Riley; Make Room for Daddy/The Danny Thomas Show/Make Room for Granddaddy; Annie Oakley; Rocky Jones, Space Ranger; Lassie; Father Knows Best; The Adventures of Rin Tin Tin; Jungle Jim; The Mickey Mouse Club; Fury; My Friend Flicka; Circus Boy; Bachelor Father; The Real McCoys; Leave It to Beaver; The Donna Reed Show; The Rifleman; Dennis the Menace; THE 1960s; My Three Sons; The Andy Griffith Show; Hazel; The Dick Van Dyke Show; The Lucy ShowThe Patty Duke ShowThe Farmer's Daughter; Petticoat Junction; Bewitched; The Addams Family; The Munsters; Please Don't Eat the Daisies; Lost in Space; Batman; Family Affair; Gentle Ben; Maya; Julia; Land of the Giants; Mayberry R.F.D.; Here's Lucy; The Doris Day Show; The Brady Bunch; THE 1970s; The Partridge Family; The Mary Tyler Moore Show; All in the Family / Archie Bunker's Place; The Waltons; Happy Days; Land of the Lost; Little House on the Prairie / Little House: A New Beginning; The Jeffersons; One Day at a Time; Family; The New Mickey Mouse Club; Eight Is EnoughBattlestar GalacticaMrs. Columbo / Kate Loves a Mystery; Diff'rent Strokes; Hello, Larry; The Facts of Life; THE 1980s; Gimme a Break!; Family Ties; Silver Spoons; Kate & Allie; The Cosby Show; Mr. Belvedere; Small Wonder; Growing Pains; Valerie/Valerie's Family/Valerie's Family: The Hogans/The Hogan Family; Starman; ALF; Married . . . with Children; My Two Dads; Full House; Star Trek: The Next Generation; The Wonder Years; Just the Ten of Us; Roseanne; Family Matters; Summation; Acknowledgments; Index"Contains basic biographical information, rare photos, and interesting trivia about child stars, shows, networks, and the times that defined the shows. The book spans sixty years of television history"--Provided by publisher.ActorsUnited StatesBiographyChild actorsUnited StatesBiographyActorsChild actors791.4502/809253PER010030BIO005000BIO013000bisacshGarver Kathy1945-1537926Ascher FredMiAaPQMiAaPQMiAaPQBOOK9910798276703321X child stars3787538UNINA04434nam 22005293 450 991100672500332120250609205036.097830364163593036416358(MiAaPQ)EBC31648673(Au-PeEL)EBL31648673(CKB)34825778000041(Exl-AI)31648673(OCoLC)1455111090(EXLCZ)993482577800004120240907d2024 uy 0engurcnu||||||||txtrdacontentcrdamediacrrdacarrierDefects of Solid Semiconductor Structures1st ed.Zurich :Trans Tech Publications, Limited,2024.©2024.1 online resource (179 pages)Defect and Diffusion Forum,1662-9507 ;Volume 4349783036406350 3036406352 Intro -- Defects of Solid Semiconductor Structures -- Preface -- Table of Contents -- Evaluation of Basal Plane Dislocation Behavior near Epilayer and Substrate Interface -- Body Diode Reliability of 4H-SiC MOSFETs as a Function of Epitaxial Process Parameter -- Accuracy of EVC Method for the PiN Diode Pattern on SiC Epi-Wafer -- Study on Quantification of Correlation between Current Density and UV Irradiation Intensity, Leading to Bar Shaped 1SSF Expansion -- Early Detection of Bar-Shaped 1SSF before Expansion by PL Imaging -- Analysis of Forward Bias Degradation Reduction in 4H-SiC PiN Diodes on Bonded Substrates -- Investigation of Dislocation Behaviors in 4H-SiC Substrate during Post-Growth Thermal Treatment -- The Role of Defects on SiC Device Performance and Ways to Mitigate them -- Emission of Trapped Electrons from the 4H-SiC/SiO2-Interface via Photon-Irradiance at Cryogenic Temperatures -- SiC MOSFET Gate Oxide Quality Improvement Method in Furnace Thermal Oxidation with Lower Pressure Control -- Investigating Dislocation Arrays Induced by Seed Scratches during PVT 4H-SiC Crystal Growth Using Synchrotron X-Ray Topography -- Crystal Originated Defect Monitoring and Reduction in Production Grade SmartSiC™ Engineered Substrates -- Analysis of Lattice Damage in 4H-SiC Epiwafers Implanted with High Energy Al Ions at Elevated Temperatures -- Near-Interface Defect Decomposition during NO Annealing Analyzed by Molecular Dynamics Simulations -- Differences between Polar-Face and Non-Polar Face 4H-SiC/SiO2 Interfaces Revealed by Magnetic Resonance Spectroscopy -- Investigation of BPD Faulting under Extreme Carrier Injection in Room vs High Temperature Implanted 3.3kV SiC MOSFETs -- Epitaxial Defectivity Characterization Combining Surface Voltage and Photoluminescence Mapping on 200mm 4H-SiC Wafers.Buffer Layer Dependence of Defectivity in 200mm 4H-SiC Homoepitaxy -- A Study of Process Interruptions during Pre- and Post-Buffer Layer Epitaxial Growth for Defect Reduction in 4H SiC -- Practical Improvement of Noncontact Production Monitoring of Doping in SiC Wafers with Extended Epilayer Defects -- Analysis of Defect Structures during the Early-Stages of PVT Growth of 4H-SiC Crystals -- Development of 3-Channel Inspection Analysis Technique for Defects of SiC Epitaxial Wafers Using Optical Inspection, Photoluminescence and X-Ray Topography -- High-Volume SiC Epitaxial Layer Manufacturing-Maintaining High Materials Quality of Lab Results in Production -- Non-Destructive Quantification of In-Plane Depth Distribution of Sub-Surface Damage on 4H-SiC Wafers Using Laser Light Scattering -- Macro Step Bunching/Debunching Engineering on 4° off 4H-SiC (0001) to Control the BPD-TED Conversion Ratio by Dynamic AGE-Ing® -- Charge Carrier Capture by Prominent Defect Centers in 4H-SiC -- Keyword Index -- Author Index.Special topic volume with invited peer-reviewed papers only.Diffusion and defect dataPt. A,Defect and diffusion forum ;Volume 434DefectsGenerated by AISilicon carbideGenerated by AIDefectsSilicon carbideRiccio Michele1822804Irace Andrea515880Breglio Giovanni1822805MiAaPQMiAaPQMiAaPQBOOK9911006725003321Defects of Solid Semiconductor Structures4389305UNINA