03035nam 2200613Ia 450 991100669470332120200520144314.01-61353-090-01-61344-286-6(CKB)3330000000000159(EBL)1183040(OCoLC)854971711(SSID)ssj0000550793(PQKBManifestationID)12200192(PQKBTitleCode)TC0000550793(PQKBWorkID)10523916(PQKB)10003343(MiAaPQ)EBC1183040(EXLCZ)99333000000000015920090428d2010 uy 0engur|n|---|||||txtccrRF and microwave modeling and measurement techniques for field effect transistors /Jianjun GaoRaleigh, NC SciTech Pub.c20101 online resource (351 p.)Description based upon print version of record.1-891121-89-8 Includes bibliographical references and index.Contents; Preface; Chapter 1 - Introduction; Chapter 2 - Representation of Microwave Two-Port Network; Chapter 3 - Microwave and RF Measurement Techniques; Chapter 4 - FET Small Signal Modeling and ParameterExtraction; Chapter 5 - FET Nonlinear Modeling and ParameterExtraction; Chapter 6 - Microwave Noise Modeling and ParameterExtraction Technique for FETs; Chapter 7 - Artificial Neural Network Modeling Techniquefor FET; References; IndexThis book is an introduction to microwave and RF signal modeling and measurement techniques for field effect transistors. It assumes only a basic course in electronic circuits and prerequisite knowledge for readers to apply the techniques and improve the performance of integrated circuits, reduce design cycles and increase their chance at first time success. The first chapters offer a general overview and discussion of microwave signal and noise matrices, and microwave measurement techniques. The following chapters address modeling techniques for field effect transistors and cover models such Field-effect transistorsTestingCompound semiconductorsTestingField-effect transistorsMathematical modelsCompound semiconductorsMathematical modelsMicrowave measurementsRadio measurementsField-effect transistorsTesting.Compound semiconductorsTesting.Field-effect transistorsMathematical models.Compound semiconductorsMathematical models.Microwave measurements.Radio measurements.621.3815/284Gao Jianjun1968-1617788MiAaPQMiAaPQMiAaPQBOOK9911006694703321RF and microwave modeling and measurement techniques for field effect transistors4390367UNINA