01452oam 2200445zu 450 991100667080332120210807003512.00-8155-1634-7(CKB)111056552535310(SSID)ssj0000071553(PQKBManifestationID)11971831(PQKBTitleCode)TC0000071553(PQKBWorkID)10090595(PQKB)10094368(EXLCZ)9911105655253531020160829d1989 uy engtxtccrCharacterization of semiconductor materials : principles and methods[Place of publication not identified]Noyes Publications1989Materials science and process technology series Characterization of semiconductor materials Bibliographic Level Mode of Issuance: Monograph0-8155-1200-7 SemiconductorsHandbooks, manuals, etcPhysicsHILCCPhysical Sciences & MathematicsHILCCElectricity & MagnetismHILCCSemiconductorsPhysicsPhysical Sciences & MathematicsElectricity & Magnetism621.3815/2McGuire G. EPQKBBOOK9911006670803321Characterization of semiconductor materials : principles and methods4392109UNINA