04037nam 2200673 a 450 991100485010332120200520144314.01-283-29379-X97866132937941-4377-7884-4(CKB)2550000000048212(EBL)858639(OCoLC)776108189(SSID)ssj0000630406(PQKBManifestationID)12254414(PQKBTitleCode)TC0000630406(PQKBWorkID)10745760(PQKB)11068417(MiAaPQ)EBC858639(PPN)167710109(EXLCZ)99255000000004821220111128d2012 uy 0engur|n|---|||||txtccrDevelopments in surface contamination and cleaningVolume fourDetection, characterization, and analysis of contaminants /edited by Rajiv Kohli and K.L. Mittal1st ed.Amsterdam William Andrew20121 online resource (361 p.)Description based upon print version of record.0-12-810368-X 1-4377-7883-6 Includes bibliographical references and index.Front Cover; Developments in Surface Contamination and Cleaning; Copyright; Contents; Preface; About the Editors; Contributors; Chapter 1 - Basics and Sampling of Particles for Size Analysis and Identification; 1.Introduction and basics; 2.Sampling; 3.Solvents and solubility parameters; 4.Cleanroom airflows and their consideration in contamination sampling; 5.Summary; References; Chapter 2 - Computational Fluid Dynamics of Particle Transport and Deposition; 1 Introduction; 2 Formulation; 3 Applications; 4 Conclusions; Acknowledgments; ReferencesChapter 3 - Methods for Monitoring and Measuring Cleanliness of Surfaces1 Introduction; 2 Types of Contaminants; 3 Product Cleanliness Levels; 4 Methods for Monitoring Surface Cleanliness; 5 Summary; Disclaimer; Acknowledgment; References; Chapter 4 - Size Analysis and Identification of Particles; 1 Introduction; 2 Particle Identification; 3 Summary; References; Chapter 5 - Developments in Imaging and Analysis Techniques for Micro- and Nanosize Particles and Surface Features; 1 Introduction; 2 Impact of Contaminants; 3 Nature and Size of Particles4 Recent Developments in Characterization Techniques5 Miscellaneous Innovative Applications of Characterization Methods; 6 Summary; Disclaimer; References; Chapter 6 - Atomic Force Microscopy for Characterization of Surfaces, Particles, and Their Interactions; 1 Introduction; 2 AFM - Modes of Operation; 3 Adhesion Forces; 4 Application of AFM; 5 Summary; References; Index In this series Rajiv Kohli and Kash Mittal have brought together the work of experts from different industry sectors and backgrounds to provide a state-of-the-art survey and best-practice guidance for scientists and engineers engaged in surface cleaning or handling the consequences of surface contamination. The expert contributions in this volume cover important fundamental aspects of surface contamination that are key to understanding the behavior of specific types of contaminants. This understanding is essential to develop preventative and mitigation methods for contamination contSurfaces (Technology)InspectionSurface contaminationPreventionCleaningCoatingsDust controlSurfaces (Technology)Inspection.Surface contaminationPrevention.Cleaning.Coatings.Dust control.620.44Kohli Rajiv312362Mittal K. L1185827MiAaPQMiAaPQMiAaPQBOOK9911004850103321Developments in surface contamination and cleaning4390211UNINA