01028nam 2200349 450 99619886200331620231020022155.01-5090-9801-1(CKB)1000000000330896(NjHacI)991000000000330896(EXLCZ)99100000000033089620231020d2006 uy 0engur|||||||||||txtrdacontentcrdamediacrrdacarrier2006 15th Asian Test Symposium /IEEE Computer SocietyLos Alamitos, California :IEEE,2006.1 online resource (xxiii, 451 pages) illustrations0-7695-2628-4 15th Asian Test Symposium atsElectronic circuitsTestingElectronic circuitsTesting.621.381548015192NjHacINjHaclPROCEEDING9961988620033162006 15th Asian Test Symposium2422583UNISA01009nas 2200373 c 450 991089463690332120260218111056.0(CKB)3790000000119205(DE-599)ZDB2522729-4(OCoLC)643342826(DE-101)997792019(DE-599)2522729-4(EXLCZ)99379000000011920520091102a19809999 |y |engur|||||||||||txtrdacontentcrdamediacrrdacarrierNexusthe Canadian student journal of anthropologyDepartment of Anthropology, McMaster UniversityHamilton, Ontario1980-Online-RessourceGesehen am 02.11.09Zeitschriftgnd-content100570PHILOSDE-12fid0355DE-1010012JOURNAL9910894636903321Nexus1293188UNINA