02760nam 22005535 450 991088789400332120250701103230.03-031-59185-210.1007/978-3-031-59185-3(MiAaPQ)EBC31674291(Au-PeEL)EBL31674291(CKB)35308993800041(DE-He213)978-3-031-59185-3(EXLCZ)993530899380004120240913d2024 u| 0engurcnu||||||||txtrdacontentcrdamediacrrdacarrierSilicon Components and Processes Self Study Properties of Silicon Crystals and PN Junctions /by Badih El-Kareh, Lou N. Hutter1st ed. 2024.Cham :Springer Nature Switzerland :Imprint: Springer,2024.1 online resource (567 pages)Includes index.3-031-59184-4 This book is one of a series of five volumes forming an integrated, self-study course on silicon device physics, modes of operation, characterization, and fabrication. The series is based on many years of the author’s experience in academic and industrial teaching of semiconductors. The books are suitable for both class-teaching and self-study. The authors have designed the content to enable readers to be introduced gradually to semiconductors, in particular silicon components. The presentation includes many illustrations, practical examples, review questions and problems at the end of each chapter. Answers to review questions and solutions to problems will be provided for “self-check”. Complements courses covering silicon device physics, mode of components, characterization, and fabrication; Enables comprehensive, self-study in semiconductors, aimed at practicing engineers or university students; Includes many illustrations, practical examples, review questions and problems at the end of each chapter.Electronic circuitsElectronicsSolid state physicsElectronic Circuits and SystemsElectronics and Microelectronics, InstrumentationElectronic DevicesElectronic circuits.Electronics.Solid state physics.Electronic Circuits and Systems.Electronics and Microelectronics, Instrumentation.Electronic Devices.661.0683El-Kareh Badih720566Hutter Lou N.MiAaPQMiAaPQMiAaPQBOOK9910887894003321Silicon Components and Processes Self Study4256396UNINA