02628oas 22008053 450 991087459980332120251106213014.01065-2221(OCoLC)556575073(CONSER) 2018200150(CKB)5280000000213331(EXLCZ)99528000000021333120100315a19919999 uy aengurbn||||||abpurbn||||||adatxtrdacontentcrdamediacrrdacarrierProceedings /Annual IEEE Semiconductor Thermal Measurement and Management SymposiumNew York, NY :Institute of Electrical and Electronics Engineers,1991-2577-1000 IEEE SEMI-THERM SymposiumAnnual IEEE Semiconductor Thermal Measurement and Management SymposiumAnnual Semiconductor Thermal Measurement and Management SymposiumSEMI-THERMSemiconductor Thermal Measurement and Management SymposiumProceedingsSemiconductorsThermal propertiesCongressesSemiconductorsCoolingCongressesAmorphous semiconductorsThermal propertiesCongressesIntegrated circuitsCongressesAmorphous semiconductorsThermal propertiesfast(OCoLC)fst00807853Integrated circuitsfast(OCoLC)fst00975535SemiconductorsCoolingfast(OCoLC)fst01112209SemiconductorsThermal propertiesfast(OCoLC)fst01112264Conference papers and proceedings.fastSemiconductorsThermal propertiesSemiconductorsCoolingAmorphous semiconductorsThermal propertiesIntegrated circuitsAmorphous semiconductorsThermal properties.Integrated circuits.SemiconductorsCooling.SemiconductorsThermal properties.621621.3815/2IEEE Components, Hybrids, and Manufacturing Technology Society.OCLCEOCLCEOCLCQOCLCFOCLCOOCLOCLCOFXGTXJCUDOCLCQDLCOCLCQAU@OCLU3WOCLCLOCLCQCONFERENCE9910874599803321Proceedings57126UNINA