02409nas 22006133 450 991087459980332120211024213021.01065-2221(OCoLC)556575073(CKB)5280000000213331(CONSER)--2018200150(EXLCZ)99528000000021333120100315a19919999 --- aengurbn||||||abpurbn||||||adatxtrdacontentcrdamediacrrdacarrierProceedings /Annual IEEE Semiconductor Thermal Measurement and Management SymposiumNew York, NY :Institute of Electrical and Electronics Engineers,1991-2577-1000 IEEE SEMI-THERM SymposiumAnnual IEEE Semiconductor Thermal Measurement and Management SymposiumAnnual Semiconductor Thermal Measurement and Management SymposiumSEMI-THERMSemiconductor Thermal Measurement and Management SymposiumIEEE SEMICONDUCTOR THERMAL MEASUREMENT AND MANAGEMENT SYMPOSIUMIEEE SYMPOSIUM SEMICONDUCTOR THERMAL MEASUREMENT AND MANAGEMENTProceedingsSemiconductorsThermal propertiesCongressesSemiconductorsCoolingCongressesAmorphous semiconductorsThermal propertiesCongressesIntegrated circuitsCongressesAmorphous semiconductorsThermal propertiesfast(OCoLC)fst00807853Integrated circuitsfast(OCoLC)fst00975535SemiconductorsCoolingfast(OCoLC)fst01112209SemiconductorsThermal propertiesfast(OCoLC)fst01112264Conference papers and proceedings.fastSemiconductorsThermal propertiesSemiconductorsCoolingAmorphous semiconductorsThermal propertiesIntegrated circuitsAmorphous semiconductorsThermal properties.Integrated circuits.SemiconductorsCooling.SemiconductorsThermal properties.621621.3815/2IEEE Components, Hybrids, and Manufacturing Technology Society.CONFERENCE9910874599803321Proceedings57126UNINA